发现好书期刊，享受阅读乐趣

海量图书期刊资源，随时随地畅享阅读乐趣

[IEEE 2012 6th International Workshop on Software Clones (IWSC) - Zurich, Switzerland (2012.06.4-2012.06.4)] 2012 6th International Workshop on Software Clones (IWSC) - An accurate estimation of the Levenshtein distance using metric trees and Manhattan distance

[IEEE 2012 6th International Workshop on Software Clones (IWSC) - Zurich, Switzerland (2012.06.4-2012.06.4)] 2012 6th International Workshop on Software Clones (IWSC) - An accurate estimation of the Levenshtein distance using metric trees and Manhattan distance

Lavoie, Thierry; Merlo, Ettore

作者Lavoie, Thierry; Merlo, Ettore
文件大小312.45KB
发表时间2012
DOI10.1109/iwsc.2012.6227861
页码1-7

← 返回【学霸图书馆】主页