[IEEE 2012 IEEE 11th International Conference on Solid-State and Integrated Circuit Technology (ICSICT) - Xian, China (2012.10.29-2012.11.1)] 2012 IEEE 11th International Conference on Solid-State and Integrated Circuit Technology - Effects of radiation on the bipolar resistive switching characteristics of Al/HfO2 /ITO structure
- 作者Wu, You-Lin; Huang, Chiung-Yi; Lin, Jing-Jenn
- 文件大小286.19KB
- 发表时间2012
- DOI10.1109/icsict.2012.6467646
- 页码1-3
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