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[IEEE 2012 IEEE International Test Conference (ITC) - Anaheim, CA, USA (2012.11.5-2012.11.8)] 2012 IEEE International Test Conference - FALCON: Rapid statistical fault coverage estimation for complex designs

[IEEE 2012 IEEE International Test Conference (ITC) - Anaheim, CA, USA (2012.11.5-2012.11.8)] 2012 IEEE International Test Conference - FALCON: Rapid statistical fault coverage estimation for complex designs

Mirkhani, Shahrzad; Abraham, Jacob A.; Vo, Toai; Jun, Hongshin; Eklow, Bill

作者Mirkhani, Shahrzad; Abraham, Jacob A.; Vo, Toai; Jun, Hongshin; Eklow, Bill
文件大小838.04KB
发表时间2012
DOI10.1109/test.2012.6401584
页码1-10

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