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Microscopic Degradation Analysis of RF-Stressed AlGaN/GaN HEMTs

Microscopic Degradation Analysis of RF-Stressed AlGaN/GaN HEMTs

Gütle, Frank; Baeumler, Martina; Dammann, Michael; Cäsar, Markus; Walcher, Herbert; Waltereit, Patrick; Bronner, Wolfgang; Müller, Stefan; Kiefer, Rudolf; Quay, Rüdiger; Mikulla, Michael; Ambacher, Oliver; Graff, Andreas; Altmann, Frank; Simon, Michel
  • 期刊名称Materials Science Forum
  • 作者Gütle, Frank; Baeumler, Martina; Dammann, Michael; Cäsar, Markus; Walcher, Herbert; Waltereit, Patrick; Bronner, Wolfgang; Müller, Stefan; Kiefer, Rudolf; Quay, Rüdiger; Mikulla, Michael; Ambacher, Oliver; Graff, Andreas; Altmann, Frank; Simon, Michel
  • 卷第725卷
  • 电子ISSN1662-9752
  • 文件大小1116.47KB
  • 发表时间2012-7
  • DOI10.4028/www.scientific.net/MSF.725.79
  • 页码79-82
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