Microscopic Degradation Analysis of RF-Stressed AlGaN/GaN HEMTs
Gütle, Frank; Baeumler, Martina; Dammann, Michael; Cäsar, Markus; Walcher, Herbert; Waltereit, Patrick; Bronner, Wolfgang; Müller, Stefan; Kiefer, Rudolf; Quay, Rüdiger; Mikulla, Michael; Ambacher, Oliver; Graff, Andreas; Altmann, Frank; Simon, Michel
- 期刊名称Materials Science Forum
- 作者Gütle, Frank; Baeumler, Martina; Dammann, Michael; Cäsar, Markus; Walcher, Herbert; Waltereit, Patrick; Bronner, Wolfgang; Müller, Stefan; Kiefer, Rudolf; Quay, Rüdiger; Mikulla, Michael; Ambacher, Oliver; Graff, Andreas; Altmann, Frank; Simon, Michel
- 卷第725卷
- 电子ISSN1662-9752
- 文件大小1116.47KB
- 发表时间2012-7
- DOI10.4028/www.scientific.net/MSF.725.79
- 页码79-82