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SPIE Proceedings [SPIE IS&T/SPIE Electronic Imaging - Burlingame, California, USA (Sunday 22 January 2012)] Stereoscopic Displays and Applications XXIII - Supervised disparity estimation

SPIE Proceedings [SPIE IS&T/SPIE Electronic Imaging - Burlingame, California, USA (Sunday 22 January 2012)] Stereoscopic Displays and Applications XXIII - Supervised disparity estimation

Vandewalle, Patrick; Woods, Andrew J.; Holliman, Nicolas S.; Varekamp, Chris; Favalora, Gregg E.
  • 作者Vandewalle, Patrick; Woods, Andrew J.; Holliman, Nicolas S.; Varekamp, Chris; Favalora, Gregg E.
  • 卷第8288卷
  • 印刷ISSN0277-786X
  • 文件大小11306.67KB
  • 发表时间2012
  • DOI10.1117/12.908268
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