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A different approach for determining the responsivity of n
<sup>+</sup>
p detectors using scanning electron microscopy

A different approach for determining the responsivity of n ⁺ p detectors using scanning electron microscopy

Esebamen, Omeime Xerviar; Thungström, Göran; Nilsson, Hans-Erik

期刊名称Journal of Semiconductors
作者Esebamen, Omeime Xerviar; Thungström, Göran; Nilsson, Hans-Erik
卷第33卷
期第7期
印刷ISSN1674-4926
文件大小302.60KB
发表时间2012-07
DOI10.1088/1674-4926/33/7/074002

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