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Microwave Atomic Force Microscopy: Quantitative Measurement and Characterization of Electrical Properties on the Nanometer Scale

Microwave Atomic Force Microscopy: Quantitative Measurement and Characterization of Electrical Properties on the Nanometer Scale

Zhang, Lan; Ju, Yang; Hosoi, Atsushi; Fujimoto, Akifumi

期刊名称Applied Physics Express
作者Zhang, Lan; Ju, Yang; Hosoi, Atsushi; Fujimoto, Akifumi
卷第5卷
期第1期
印刷ISSN1882-0778
电子ISSN1882-0786
文件大小172.72KB
发表时间2012-01
DOI10.1143/apex.5.016602

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