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SPIE Proceedings [SPIE IS&T/SPIE Electronic Imaging - Burlingame, California (Sunday 22 January 2012)] Image Processing: Algorithms and Systems X; and Parallel Processing for Imaging Applications II - <title>Multi-resolution analysis for region of interest extraction in thermographic nondestructive evaluation</title>

SPIE Proceedings [SPIE IS&T/SPIE Electronic Imaging - Burlingame, California (Sunday 22 January 2012)] Image Processing: Algorithms and Systems X; and Parallel Processing for Imaging Applications II - Multi-resolution analysis for region of interest extraction in thermographic nondestructive evaluation

Ortiz-Jaramillo, B.; Fandiño Toro, H. A.; Benitez-Restrepo, H. D.; Orjuela-Vargas, S. A.; Castellanos-Domínguez, G.; Philips, W.; Egiazarian, Karen O.; Agaian, Sos S.; Gotchev, Atanas P.; Recker, John; Wang, Guijin
  • 作者Ortiz-Jaramillo, B.; Fandiño Toro, H. A.; Benitez-Restrepo, H. D.; Orjuela-Vargas, S. A.; Castellanos-Domínguez, G.; Philips, W.; Egiazarian, Karen O.; Agaian, Sos S.; Gotchev, Atanas P.; Recker, John; Wang, Guijin
  • 卷第8295卷
  • 印刷ISSN0277-786X
  • 文件大小985.20KB
  • 发表时间2012
  • DOI10.1117/12.912079
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