[IEEE 2012 IEEE/IFIP 20th International Conference on VLSI and System-on-Chip (VLSI-SoC) - Santa Cruz, CA, USA (2012.10.7-2012.10.10)] 2012 IEEE/IFIP 20th International Conference on VLSI and System-on-Chip (VLSI-SoC) - Dynamic voltage scaling for SEU-tolerance in low-power memories
- 作者Kim, Seokjoong; Guthaus, Matthew R.
- 文件大小1106.53KB
- 发表时间2012
- DOI10.1109/vlsi-soc.2012.6379031
- 页码207-212