Secondary fluorescence in electron probe microanalysis of material couples
Llovet, X; Pinard, P T; Donovan, J J; Salvat, F
- 期刊名称Journal of Physics D: Applied Physics
- 作者Llovet, X; Pinard, P T; Donovan, J J; Salvat, F
- 卷第45卷
- 期第22期
- 印刷ISSN0022-3727
- 电子ISSN1361-6463
- 文件大小250.31KB
- 发表时间2012-06-06
- DOI10.1088/0022-3727/45/22/225301