SPIE Proceedings [SPIE SPIE Optical Engineering + Applications - San Diego, California, USA (Sunday 12 August 2012)] X-Ray Free-Electron Lasers: Beam Diagnostics, Beamline Instrumentation, and Applications - Profiling structured beams using injected aerosols
- 作者Loh, N. D.; Starodub, Dmitri; Lomb, Lukas; Hampton, Christina Y.; Martin, Andrew V.; Sierra, Raymond G.; Barty, Anton; Aquila, Andrew; Schulz, Joachim; Steinbrener, Jan; Shoeman, Robert L.; Kassemeyer, Stephan; Bostedt, Christoph; Bozek, John; Epp, Sascha W.; Erk, Benjamin; Hartmann, Robert; Rolles, Daniel; Rudenko, Artem; Rudek, Benedikt; Foucar, Lutz; Kimmel, Nils; Weidenspointner, Georg; Hauser, Günther; Holl, Peter; Pedersoli, Emanuele; Liang, MengNing; Hunter, Mark S.; Gumprecht, Lars; Coppola, Nicola; Wunderer, Cornelia; Graafsman, Heinz; Maia, Filipe R. N. C.; Ekeberg, Tomas; Hantke, Max; Fleckenstein, Holger; Hirsemann, Helmut; Nass, Karol; White, Thomas A.; Tobias, Herbert J.; Farquar, George R.; Benner, W. Henry; Hau-Riege, Stefan; Reich, Christian; Hartmann, Andreas; Soltau, Heike; Marchesini, Stefano; Bajt, Sasa; Barthelmess, Miriam; Strueder, Lothar; Ullrich, Joachim; Bucksbaum, Philip; Hodgson, Keith O.; Frank, Mathias; Schlichting, Ilme; Chapman, Henry N.; Bogan, Michael J.; Moeller, Stefan P.; Yabashi, Makina; Hau-Riege, Stefan P.
- 卷第8504卷
- 印刷ISSN0277-786X
- 文件大小1706.28KB
- 发表时间2012
- DOI10.1117/12.930075
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