[ASME ASME 2012 Third International Conference on Micro/Nanoscale Heat and Mass Transfer - Atlanta, Georgia, USA (Saturday 3 March 2012)] ASME 2012 Third International Conference on Micro/Nanoscale Heat and Mass Transfer - Thermoelectric Characterization of Ge
2
Sb
2
Te
5
Films for Phase-Change Memory
Lee, Jaeho; Kodama, Takashi; Won, Yoonjin; Asheghi, Mehdi; Goodson, Kenneth E.
- 作者Lee, Jaeho; Kodama, Takashi; Won, Yoonjin; Asheghi, Mehdi; Goodson, Kenneth E.
- 文件大小1424.34KB
- 发表时间2012
- DOI10.1115/mnhmt2012-75092