SPIE Proceedings [SPIE SPIE Optical Engineering + Applications - San Diego, California, USA (Sunday 12 August 2012)] Optics and Photonics for Information Processing VI - The sensitivity of bit error rate (BER) performance in multi-carrier (OFDM) and single-carrier
Albdran, Saleh; Awwal, Abdul A. S.; Iftekharuddin, Khan M.; Alshammari, Ahmed; Matin, Mohammad
- 作者Albdran, Saleh; Awwal, Abdul A. S.; Iftekharuddin, Khan M.; Alshammari, Ahmed; Matin, Mohammad
- 卷第8498卷
- 印刷ISSN0277-786X
- 文件大小220.81KB
- 发表时间2012
- DOI10.1117/12.931672