SPIE Proceedings [SPIE SPIE Proceedings - (Sunday 12 February 2012)] - Advanced photon processing and measurement technology
- 作者Matsuno, Kenichi; Abramski, Krzysztof M.; Plinski, Edward F.; Wolinski, Wieslaw
- 印刷ISSN0277-786X
- 文件大小657.64KB
- 发表时间2012
- DOI10.1117/12.515805
- 页码476-481
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