SPIE Proceedings [SPIE SPIE Proceedings - (Sunday 12 February 2012)] - Techniques and devices for optical correlation diagnostics of rough surfaces
- 作者Angelsky, Oleg V.; Maksimyak, Peter P.; Angelsky, Oleg V.
- 印刷ISSN0277-786X
- 文件大小582.98KB
- 发表时间2012
- DOI10.1117/12.560200
- 页码375-380
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