SPIE Proceedings [SPIE 2012 International Workshop on Image Processing and Optical Engineering - Harbin, China (Monday 9 January 2012)] 2012 International Workshop on Image Processing and Optical Engineering - Image registration based on geometric pattern matching
Wang, Ke; Guo, Hai; Ding, Qun; Yan, Ying; Shi, Tielin; Liu, Shiyuan; Xia, Qi
- 作者Wang, Ke; Guo, Hai; Ding, Qun; Yan, Ying; Shi, Tielin; Liu, Shiyuan; Xia, Qi
- 卷第8335卷
- 印刷ISSN0277-786X
- 文件大小693.98KB
- 发表时间2012
- DOI10.1117/12.918113