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Improving the quality of EMI Releases by leveraging the EMI Testing Infrastructure

Improving the quality of EMI Releases by leveraging the EMI Testing Infrastructure

Aiftimiei, C; Ceccanti, A; Dongiovanni, D; Meglio, A Di; Giacomini, F
  • 期刊名称Journal of Physics: Conference Series
  • 作者Aiftimiei, C; Ceccanti, A; Dongiovanni, D; Meglio, A Di; Giacomini, F
  • 卷第396卷
  • 期第5期
  • 印刷ISSN1742-6588
  • 电子ISSN1742-6596
  • 文件大小1092.25KB
  • 发表时间2012-12-13
  • DOI10.1088/1742-6596/396/5/052030
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