SPIE Proceedings [SPIE SPIE Proceedings - (Sunday 12 February 2012)] - Measurement of the third order nonlinear coefficients of organic materials by a holographic technique in the picosecond regime
Rodriguez, L.; Simos, Christos; Sylla, Mamadou; Marcano O., Aristides A.; Nguyen Phu, Xuan; Marcano O., Aristides; Paz, Jose Luis
- 作者Rodriguez, L.; Simos, Christos; Sylla, Mamadou; Marcano O., Aristides A.; Nguyen Phu, Xuan; Marcano O., Aristides; Paz, Jose Luis
- 印刷ISSN0277-786X
- 文件大小193.79KB
- 发表时间2012
- DOI10.1117/12.589229
- 页码408-412