The role of shallow traps in dynamic characterization of organic semiconductor devices
- 期刊名称Journal of Applied Physics
- 作者Knapp, Evelyne; Ruhstaller, Beat
- 卷第112卷
- 期第2期
- 印刷ISSN0021-8979
- 电子ISSN1089-7550
- 文件大小615.13KB
- 发表时间2012-07-15
- DOI10.1063/1.4739303
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