[IEEE Digest of Papers. 1992 IEEE VLSI Test Symposium - Atlantic City, NJ, USA (7-9 April 1992)] Digest of Papers. 1992 IEEE VLSI Test Symposium - Empirical bounds on fault coverage loss due to LFSR aliasingDebany, W.H.; Gorniak, M.J.; Daskiewich, D.E.; Macera, A.R.; Kwiat, K.A.; Dussault, H.B. · 1992

[IEEE Digest of Papers. 1992 IEEE VLSI Test Symposium - Atlantic City, NJ, USA (7-9 April 1992)] Digest of Papers. 1992 IEEE VLSI Test Symposium - Effective concurrent test for a parallel-input multiplier using modulo 3Debany, W.H.; Macera, A.R.; Daskiewich, D.E.; Gorniak, M.J.; Kwiat, K.A.; Dussault, H.B. · 1992