Materials and Reliability Handbook for Semiconductor Optical and Electron Devices || Strain Effects in AlGaN/GaN HEMTs
Ueda, Osamu; Pearton, Stephen J.
- 作者Ueda, Osamu; Pearton, Stephen J.
- 文件大小1825.01KB
- 发表时间2013
- DOI10.1007/978-1-4614-4337-7_12
- 页码381-429