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A New Technique for the Determination of the Critical Current Density in Superconducting Films and Flat Samples

A New Technique for the Determination of the Critical Current Density in Superconducting Films and Flat Samples

McLoughlin, Conor; Bernstein, Pierre; Thimont, Yohann; Siejka, J.
  • 期刊名称Journal of Superconductivity and Novel Magnetism
  • 作者McLoughlin, Conor; Bernstein, Pierre; Thimont, Yohann; Siejka, J.
  • 卷第26卷
  • 期第3期
  • 印刷ISSN1557-1939
  • 电子ISSN1557-1947
  • 文件大小300.85KB
  • 发表时间2013-03
  • DOI10.1007/s10948-012-1782-z
  • 页码545-548
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