Materials and Reliability Handbook for Semiconductor Optical and Electron Devices || Reliability Studies in the Real World
- 作者Ueda, Osamu; Pearton, Stephen J.
- 文件大小2834.04KB
- 发表时间2013
- DOI10.1007/978-1-4614-4337-7_11
- 页码319-379
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Materials Fundamentals of Molecular Beam Epitaxy || Alloy PhasesTsao, Jeffrey Y. · 1993
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