Wide-area scanner for high-speed atomic force microscopy
Watanabe, Hiroki; Uchihashi, Takayuki; Kobashi, Toshihide; Shibata, Mikihiro; Nishiyama, Jun; Yasuda, Ryohei; Ando, Toshio
- 期刊名称Review of Scientific Instruments
- 作者Watanabe, Hiroki; Uchihashi, Takayuki; Kobashi, Toshihide; Shibata, Mikihiro; Nishiyama, Jun; Yasuda, Ryohei; Ando, Toshio
- 卷第84卷
- 期第5期
- 印刷ISSN0034-6748
- 文件大小2693.28KB
- 发表时间2013
- DOI10.1063/1.4803449