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[Int. Test Conference International Test Conference - Washington, DC, USA (2-6 Oct. 1994)] Proceedings., International Test Conference - Testability strategy of the Alpha AXP 21164 microprocessorBhavsar, D.K.; Edmondson, J.H. · 1994
Digitally intensive wireless transceiversStaszewski, Robert Bogdan · IEEE Design & Test of Computers · 2012
Adaptive Alternate Analog TestStratigopoulos, Haralampos-G.; Mir, Salvador · IEEE Design & Test of Computers · 2012
The Olympus synthesis systemDe Micheli, G.; Ku, D.; Mailhot, F.; Truong, T. · IEEE Design & Test of Computers · 1990
Clock system designWagner, K.D. · IEEE Design & Test of Computers · 1988
Automatic generation of parallel CRC circuitsSprachmann, M. · IEEE Design & Test of Computers · 2001
Automated BIST for sequential logic synthesisStroud, C.E. · IEEE Design & Test of Computers · 1988
Minimizing FPGA interconnect delaysBrown, S.; Khellah, M.; Vranesic, N. · IEEE Design & Test of Computers · 1996