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SPIE Proceedings [SPIE SPIE Defense, Security, and Sensing - Baltimore, Maryland, USA (Monday 29 April 2013)] Infrared Technology and Applications XXXIX - Temperature dependence of 1/f noise, defects, and dark current in small pitch MWIR and LWIR HDVIP® HgCdTe FPAs

SPIE Proceedings [SPIE SPIE Defense, Security, and Sensing - Baltimore, Maryland, USA (Monday 29 April 2013)] Infrared Technology and Applications XXXIX - Temperature dependence of 1/f noise, defects, and dark current in small pitch MWIR and LWIR HDVIP® HgCdTe FPAs

Strong, Roger L.; Kinch, Michael A.; Armstrong, John M.; Andresen, Bjørn F.; Fulop, Gabor F.; Hanson, Charles M.; Norton, Paul R.; Robert, Patrick
  • 作者Strong, Roger L.; Kinch, Michael A.; Armstrong, John M.; Andresen, Bjørn F.; Fulop, Gabor F.; Hanson, Charles M.; Norton, Paul R.; Robert, Patrick
  • 卷第8704卷
  • 印刷ISSN0277-786X
  • 文件大小1234.69KB
  • 发表时间2013
  • DOI10.1117/12.2015816
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