Exponential Asymptotics for Thin Film Rupture
- 期刊名称SIAM Journal on Applied Mathematics
- 作者Chapman, S. Jonathan; Trinh, Philippe H.; Witelski, Thomas P.
- 卷第73卷
- 期第1期
- 印刷ISSN0036-1399
- 电子ISSN1095-712X
- 文件大小1451.70KB
- 发表时间2013-01
- DOI10.1137/120872012
- 页码232-253
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