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[IEEE 2013 IEEE International Conference on Solid Dielectrics (ICSD) - Bologna, Italy (2013.06.30-2013.07.4)] 2013 IEEE International Conference on Solid Dielectrics (ICSD) - Influence of trap depths on space charge formation and accumulation characteristics in low density polyethylene

[IEEE 2013 IEEE International Conference on Solid Dielectrics (ICSD) - Bologna, Italy (2013.06.30-2013.07.4)] 2013 IEEE International Conference on Solid Dielectrics (ICSD) - Influence of trap depths on space charge formation and accumulation characteristics in low density polyethylene

Li, Guochang; Li, Shengtao; Min, Daomin; Zhao, Ni; Zhu, Yuanwei

作者Li, Guochang; Li, Shengtao; Min, Daomin; Zhao, Ni; Zhu, Yuanwei
文件大小827.14KB
发表时间2013
DOI10.1109/ICSD.2013.6619662
页码698-701

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