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SPIE Proceedings [SPIE SPIE Defense, Security, and Sensing - Baltimore, Maryland, USA (Monday 29 April 2013)] Scanning Microscopies 2013: Advanced Microscopy Technologies for Defense, Homeland Security, Forensic, Life, Environmental, and Industrial Sciences - A Large range metrological atomic force microscope and its uncertainty analysis

SPIE Proceedings [SPIE SPIE Defense, Security, and Sensing - Baltimore, Maryland, USA (Monday 29 April 2013)] Scanning Microscopies 2013: Advanced Microscopy Technologies for Defense, Homeland Security, Forensic, Life, Environmental, and Industrial Sciences - A Large range metrological atomic force microscope and its uncertainty analysis

Gao, S.; Li, Q.; Li, W.; Lu, M.; Shi, Y.; Postek, Michael T.; Newbury, Dale E.; Platek, S. Frank; Maugel, Tim K.
  • 作者Gao, S.; Li, Q.; Li, W.; Lu, M.; Shi, Y.; Postek, Michael T.; Newbury, Dale E.; Platek, S. Frank; Maugel, Tim K.
  • 卷第8729卷
  • 印刷ISSN0277-786X
  • 文件大小858.35KB
  • 发表时间2013
  • DOI10.1117/12.2017674
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