Symmetrical ESD protection for advanced CMOS technology dedicated to 100GHz RF application

Galy, Ph.; Lim, T.; Bourgeat, J.; Jimenez, J.; Heitz, B.; Marin-Cudraz, D.; Benech, Ph.; Fournier, J.M.

期刊名称Microelectronics Reliability
作者Galy, Ph.; Lim, T.; Bourgeat, J.; Jimenez, J.; Heitz, B.; Marin-Cudraz, D.; Benech, Ph.; Fournier, J.M.
卷第53卷
印刷ISSN0026-2714
文件大小2219.42KB
发表时间2013-9
DOI10.1016/j.microrel.2013.07.109
页码1284-1287

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