On a modified projection scheme of the least-squares method for the modeling of the distribution of minority charge carriers generated by an electron beam in a homogeneous semiconductor material

• 期刊名称Journal of Surface Investigation. X-ray, Synchrotron and Neutron Techniques
• 作者Seregina, E. V.; Stepovich, M. A.; Makarenkov, A. M.
• 卷第7卷
• 期第6期
• 印刷ISSN1027-4510
• 电子ISSN1819-7094
• 文件大小323.74KB
• 发表时间2013-11
• DOI10.1134/S1027451013060177
• 页码1077-1080