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Electrostatic simulations of a local electrode atom probe: The dependence of tomographic reconstruction parameters on specimen and microscope geometry

Electrostatic simulations of a local electrode atom probe: The dependence of tomographic reconstruction parameters on specimen and microscope geometry

Loi, Shyeh Tjing; Gault, Baptiste; Ringer, Simon P.; Larson, David J.; Geiser, Brian P.
  • 期刊名称Ultramicroscopy
  • 作者Loi, Shyeh Tjing; Gault, Baptiste; Ringer, Simon P.; Larson, David J.; Geiser, Brian P.
  • 卷第132卷
  • 印刷ISSN0304-3991
  • 文件大小791.68KB
  • 发表时间2013-9
  • DOI10.1016/j.ultramic.2012.12.012
  • 页码107-113
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