On the configuration- and frequency-dependent linearity characteristics of SiGe HBTs under different impedance matching conditions
Qin, Guoxuan; Wang, Guogong; Jiang, Ningyue; Ma, Jianguo; Ma, Zhenqiang
- 期刊名称Microelectronics Reliability
- 作者Qin, Guoxuan; Wang, Guogong; Jiang, Ningyue; Ma, Jianguo; Ma, Zhenqiang
- 卷第53卷
- 期第3期
- 印刷ISSN0026-2714
- 文件大小457.36KB
- 发表时间2013-3
- DOI10.1016/j.microrel.2012.09.001
- 页码409-413