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Acute toxicity and risk of infection during total skin electron beam therapy for mycosis fungoides

Acute toxicity and risk of infection during total skin electron beam therapy for mycosis fungoides

Lloyd, Shane; Chen, Zhe; Foss, Francine M.; Girardi, Michael; Wilson, Lynn D.
  • 期刊名称Journal of the American Academy of Dermatology
  • 作者Lloyd, Shane; Chen, Zhe; Foss, Francine M.; Girardi, Michael; Wilson, Lynn D.
  • 卷第69卷
  • 期第4期
  • 印刷ISSN0190-9622
  • 文件大小134.67KB
  • 发表时间2013-10
  • DOI10.1016/j.jaad.2013.04.063
  • 页码537-543
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