[IEEE 2013 25th International Symposium on Power Semiconductor Devices & IC's (ISPSD) - Kanazawa (2013.5.26-2013.5.30)] 2013 25th International Symposium on Power Semiconductor Devices & IC's (ISPSD) - Validated electro-thermal simulations of two different power MOSFET technologies and implications on their robustness
de Filippis, Stefano; Illing, Robert; Nelhiebel, Michael; Decker, Stefan; Kock, Helmut; Irace, Andrea
- 作者de Filippis, Stefano; Illing, Robert; Nelhiebel, Michael; Decker, Stefan; Kock, Helmut; Irace, Andrea
- 文件大小1277.10KB
- 发表时间2013
- DOI10.1109/ISPSD.2013.6694414
- 页码325-328