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[IEEE 2013 IEEE 10th International Conference on ASIC (ASICON 2013) - Shenzhen, China (2013.10.28-2013.10.31)] 2013 IEEE 10th International Conference on ASIC - Parameter and UVM, making a layered testbench powerful

[IEEE 2013 IEEE 10th International Conference on ASIC (ASICON 2013) - Shenzhen, China (2013.10.28-2013.10.31)] 2013 IEEE 10th International Conference on ASIC - Parameter and UVM, making a layered testbench powerful

Geng Zhong, ; Jian Zhou, ; Bei Xia,

作者Geng Zhong, ; Jian Zhou, ; Bei Xia,
文件大小160.88KB
发表时间2013
DOI10.1109/ASICON.2013.6811929
页码1-4

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