Atomic-Scale Tomography: A 2020 Vision
- 期刊名称Microscopy and Microanalysis
- 作者Kelly, Thomas F.; Miller, Michael K.; Rajan, Krishna; Ringer, Simon P.
- 卷第19卷
- 期第3期
- 印刷ISSN1431-9276
- 电子ISSN1435-8115
- 文件大小1363.33KB
- 发表时间2013-6
- DOI10.1017/S1431927613000494
- 页码652-664
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