![Voltage Dependency of Propagating Single-Event Transient Pulsewidths in 90-nm CMOS Technology]()
Voltage Dependency of Propagating Single-Event Transient Pulsewidths in 90-nm CMOS TechnologyJunrui Qin, ; Shuming Chen, ; Bin Liang, ; Zhen Ge, ; Yibai He, ; Yankang Du, ; Biwei Liu, ; Jianjun Chen, ; Dawei Li, · IEEE Transactions on Device and Materials Reliability · 2014