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[IEEE 2013 International conference on Circuits, Controls and Communications (CCUBE) - BENGALURU, India (2013.12.27-2013.12.28)] 2013 International conference on Circuits, Controls and Communications (CCUBE) - Comparison of multiple fin heights for increasing drain current in N-FinFET

[IEEE 2013 International conference on Circuits, Controls and Communications (CCUBE) - BENGALURU, India (2013.12.27-2013.12.28)] 2013 International conference on Circuits, Controls and Communications (CCUBE) - Comparison of multiple fin heights for increasing drain current in N-FinFET

Mishra, Vimal Kumar; Chauhan, R.K.

作者Mishra, Vimal Kumar; Chauhan, R.K.
文件大小1780.13KB
发表时间2013
DOI10.1109/CCUBE.2013.6718579
页码1-5

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