[IEEE 2013 Design and Test Symposium (IDT) - Marrakesh, Morocco (2013.12.16-2013.12.18)] 2013 8th IEEE Design and Test Symposium - Test set embedding into accumulator-generated sequences targeting hard-to-detect faults

Voyiatzis, I.; Neophytou, S.; Michaeel, M.; Hadjitheophanous, S.; Sgouropoulou, C.; Efstathiou, C.

作者Voyiatzis, I.; Neophytou, S.; Michaeel, M.; Hadjitheophanous, S.; Sgouropoulou, C.; Efstathiou, C.
文件大小169.09KB
发表时间2013
DOI10.1109/idt.2013.6727147
页码1-2

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