[IEEE 2013 20th IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA) - Suzhou, China (2013.07.15-2013.07.19)] Proceedings of the 20th IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA) - Trends and challenges in solid state lighting reliability
- 作者Tao, Guoqiao
- 文件大小647.69KB
- 发表时间2013
- DOI10.1109/ipfa.2013.6599171
- 页码299-302
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