[IEEE 2013 81st ARFTG Microwave Measurement Conference (ARFTG) - Seattle, WA, USA (2013.06.7-2013.06.7)] 81st ARFTG Microwave Measurement Conference - On-wafer multi-port circuits characterization technique with a two-port VNA
- 作者Quintanel, Sebastien; Pasquet, Daniel; Bourdel, Emmanuelle; Duperrier, Cedric; Lesenechal, Dominique; Dinh, Thanh-Vinh; Descamps, Philippe
- 文件大小523.43KB
- 发表时间2013
- DOI10.1109/arftg.2013.6579058
- 页码1-4
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