[IEEE 2013 26th International Conference on VLSI Design: concurrently with the 12th International Conference on Embedded Systems - Pune, India (2013.01.5-2013.01.10)] 2013 26th International Conference on VLSI Design and 2013 12th International Conference on Embedded Systems - Observability-aware Directed Test Generation for Soft Errors and Crosstalk Faults
- 作者Basu, Kanad; Mishra, Prabhat; Patra, Priyadarsan
- 文件大小328.40KB
- 发表时间2013
- DOI10.1109/vlsid.2013.203
- 页码291-296
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