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Variability Improvement by Interface Passivation and EOT Scaling of InGaAs Nanowire MOSFETs

Variability Improvement by Interface Passivation and EOT Scaling of InGaAs Nanowire MOSFETs

Gu, Jiangjiang J.; Wang, Xinwei; Wu, Heng; Gordon, Roy G.; Ye, Peide D.

期刊名称IEEE Electron Device Letters
作者Gu, Jiangjiang J.; Wang, Xinwei; Wu, Heng; Gordon, Roy G.; Ye, Peide D.
卷第34卷
期第5期
印刷ISSN0741-3106
电子ISSN1558-0563
文件大小1141.56KB
发表时间2013-05
DOI10.1109/led.2013.2248114
页码608-610

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