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[IEEE 2013 Design and Test Symposium (IDT) - Marrakesh, Morocco (2013.12.16-2013.12.18)] 2013 8th IEEE Design and Test Symposium - Transparent testing for intra-word memory faults

[IEEE 2013 Design and Test Symposium (IDT) - Marrakesh, Morocco (2013.12.16-2013.12.18)] 2013 8th IEEE Design and Test Symposium - Transparent testing for intra-word memory faults

Voyiatzis, I.; Efstathiou, C.; Sgouropoulou, C.

作者Voyiatzis, I.; Efstathiou, C.; Sgouropoulou, C.
文件大小186.79KB
发表时间2013
DOI10.1109/idt.2013.6727144
页码1-2

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