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[IEEE 2013 15th European Conference on Power Electronics and Applications (EPE) - Lille, France (2013.09.2-2013.09.6)] 2013 15th European Conference on Power Electronics and Applications (EPE) - Measurement of a complete HV IGBT I-V-characteristic up to the breakdown point

[IEEE 2013 15th European Conference on Power Electronics and Applications (EPE) - Lille, France (2013.09.2-2013.09.6)] 2013 15th European Conference on Power Electronics and Applications (EPE) - Measurement of a complete HV IGBT I-V-characteristic up to the breakdown point

Basler, Thomas; Bhojani, Riteshkumar; Lutz, Josef; Jakob, Roland

作者Basler, Thomas; Bhojani, Riteshkumar; Lutz, Josef; Jakob, Roland
文件大小260.86KB
发表时间2013
DOI10.1109/EPE.2013.6634454
页码1-9

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