Practical guide for validated memristance measurements
Du, Nan; Shuai, Yao; Luo, Wenbo; Mayr, Christian; Schüffny, René; Schmidt, Oliver G.; Schmidt, Heidemarie
- 期刊名称Review of Scientific Instruments
- 作者Du, Nan; Shuai, Yao; Luo, Wenbo; Mayr, Christian; Schüffny, René; Schmidt, Oliver G.; Schmidt, Heidemarie
- 卷第84卷
- 期第2期
- 印刷ISSN0034-6748
- 文件大小1457.86KB
- 发表时间2013
- DOI10.1063/1.4775718