RATS: Restoration-Aware Trace Signal Selection for Post-Silicon Validation
- 期刊名称IEEE Transactions on Very Large Scale Integration (VLSI) Systems
- 作者Basu, Kanad; Mishra, Prabhat
- 卷第21卷
- 期第4期
- 印刷ISSN1063-8210
- 电子ISSN1557-9999
- 文件大小575.28KB
- 发表时间2013-04
- DOI10.1109/tvlsi.2012.2192457
- 页码605-613
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