[IEEE 2013 Euromicro Conference on Digital System Design (DSD) - Los Alamitos, CA, USA (2013.09.4-2013.09.6)] 2013 Euromicro Conference on Digital System Design - Scenario Patterns and Trace-Based Temporal Verification of Reactive Embedded Systems

• 作者Tokarnia, Alice M.; Cruz, Emerson P.
• 文件大小204.96KB
• 发表时间2013
• DOI10.1109/dsd.2013.84
• 页码734-741