[IEEE 2013 IEEE 10th International Conference on ASIC (ASICON 2013) - Shenzhen, China (2013.10.28-2013.10.31)] 2013 IEEE 10th International Conference on ASIC - Characteristics of n-MOSFETs with stress effects from neighborhood devices
- 作者Wei Tai, ; Lele Jiang, ; Wang Lei, ; Song Wen, ; Lifu Chang, ; Yuhua Cheng,
- 文件大小169.15KB
- 发表时间2013
- DOI10.1109/asicon.2013.6812059
- 页码1-3
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